PANDA
Compact X-ray fluorescence spectrometer
- Small size
- Analyzer for training and research
- Range of analyzed elements – from 11Na to 92U
- Teaching aids for secondary and higher educational institutions
- Unique set of laboratory practice tasks
- Sets of samples for laboratory practice
TECHNICAL DESCRIPTION
Purpose
The compact X-ray fluorescence spectrometer is intended for qualitative, semiquantitative and quantitative elemental analysis of solid, liquid and powder substances. The elements from 11Na to 92U are analyzed simultaneously. The analyzer is used in various analytical laboratories, and is also recommended for conducting laboratory and practical classes and research work in secondary and higher educational institutions.
Features
- Low-power X-ray tube
- The analyzer X -ray optical scheme is based on the geometry of the inversion probe, which can significantly reduce the effect of changes in the distance from the studied object to the detector, as well as the influence of sample irregularities on measurement results
- Special design features and protective interlocks provide increased safety during measurements and changing of the samples
- Methodologies for performing standard laboratory work and research projects, as well as a set of samples for them are provided
Operation principle
The operation principle of the analyzer is based on the excitation of sample atoms and subsequent detection of the X-ray fluorescence spectrum of the material under study. The energies of the characteristic lines of the spectrum correspond to chemical elements contained in the sample, and their intensities are proportional to concentrations of the corresponding elements.
A low-power X-ray tube with an end window is used as a source of primary X-ray radiation. When the sample is irradiated with X-rays, the atoms of the analyte are excited, which causes the emission of secondary characteristic radiation.
Fluorescent radiation is detected by a silicon drift detector cooled by Peltier elements. The signal from the detector is processed by an electronic circuit and converted into a spectrum. The positions of the peaks in the spectrum correspond to the energies of characteristic lines of the elements, and the peak heights (areas) are proportional to the radiation intensity.
The X-ray tube and the detector are located above the sample, which eliminates the possibility of contamination of the detector and the tube with sample particles.
To determine “light” elements (from 11Na to 20Ca), measurements can be carried out in the atmosphere of helium.
For educational purposes, a methodological manual and a set of laboratory practice tasks were developed which are supplied together with specially selected samples. To carry out research projects, a kit for carrying out sample preparation of solid and bulk materials is provided.
The analyzer is linked with a laptop. The instrument control is carried out using special software. Various operating modes of the software make it possible to measure and process spectral information for both routine analysis and scientific research. Additionally, a special module for performing laboratory practice tasks has been developed.
Delivery package
The base package includes:
- spectrometer
- tablet computer
- set of cuvettes
Additional options:
- teaching aids and a manual for carrying out laboratory practice tasks
- set of samples for laboratory work
- kit for sample preparation of powders and solid samples
- helium gas system
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Accessory kit for conducting research work |
Set of samples for educational laboratory practice |
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Holder for coins and flat samples |
Holder for powder samples |
Cuvette for solid samples of arbitrary shape |
TECHNICAL CHARACTERISTICS
| X-ray tube type | End-window type |
| Maximum rating of X-ray tube power supply | Ua up to 40 kV; Ia up to 100 μA; P up to 4 VA |
| X-ray tube anode material | Rh (Ag, W, Au, Pd, Ta — optional, to be agreed with the customer) |
| Detector | Silicon drift detector with electric cooling (Si-Pin detector — to be agreed with the customer) |
| Energy range | 1 — 35 keV |
| Energy resolution | < 130 eV (< 180 eV when using Si-Pin detector) on the Mn Kα line |
| Sample chamber atmosphere |
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| Sample holders |
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| Maximum power consumption | 25 VA |
| Dimensions (L×W×H) | 225×225×245 mm |
| Weight | 8 kg |
MAIN FUNCTIONS OF THE SPECTROMETER SOFTWARE
| Spectrometer control |
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| Base of standard samples |
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| Qualitative analysis |
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| Spectrum processing |
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| Spectrum comparison |
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| Methods of quantitative analysis |
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| Matrix effects evaluation | Available |
| Package processing of multiple spectra | Available |
| Creation of reports on measurement results | Available |
| Recalculation of measurement results on compounds | Available |
| Spectrum search |
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| Software for educational purposes | Mode for carrying out laboratory practice tasks |
METROLOGICAL PARAMETERS OF THE SPECTROMETER
| Range of analyzed elements | 13Al (Kα) — 92U (Lα) (optionally — from 11Na (Kα), to be agreed with the customer) |
| Spectral range | 1 — 40 keV |
| Energy resolution | < 130 eV (< 180 eV when using Si-Pin detector) on the Mn Kα line |
| Maximum concentration of analyzed elements | 100% |
| Minimum concentration of analyzed elements | From 0.01% |
| Long-term stability of the analyzer (relative standard deviation of the output signal) | Less than 0.3% |
| Inherent instrument error | Less than 1% |
| Sample analysis time | From 5 s |
SOFTWARE DESCRIPTION
The software provides the ability to manage the instrument, control the measurement process and analyze the acquired spectral information. Various implemented modes of the software make it convenient both for routine analysis by laboratory assistants and for various studies by high-level specialists. In addition, a special module for education and training has been developed which offers the following 7 laboratory practice tasks:
- Basics of X-ray fluorescence analysis. Moseley's law. Qualitative analysis
- X-ray tube characteristics
- Energy dispersive detector characteristics
- Optimal measurement parameters
- Quantitative analysis of chemical composition of substances
- Taking into account interfering elements when carrying out quantitative analysis
- Metrological characteristics. Concentration sensitivity and detection limits
The software interface is divided into three user parts: measurement mode, expert mode and laboratory practice.
Measurement mode
In this mode, the main measurement parameters are set: current and voltage of the X-ray tube, and exposure time. Parameters can be automatically loaded and quantitative analysis performed using previously saved measurement methodologies. Also in this mode, control over the main components of the instrument is carried out.
Also, in the measurement mode, the instrument metrological verification is performed.
Expert mode
This mode is intended for processing the acquired spectral information, as well as for developing methodologies for the rapid analysis of samples.
The spectra acquired using the measurement mode can be mathematically processed in various ways. When carrying out qualitative analysis (which is possible in automatic mode), the lines of elements are marked with chemical symbols. When doing so, the escape peaks and double peaks are taken into account.
Spectra can be compared with each other, subtracted, added and averaged. The search for measured spectra that are most similar to the current one is also possible. The background component is modeled in various ways to increase the accuracy of the analysis.
For quantitative analysis, several calculation methods are available: linear regression, the Lucas-Tooth method with and without alpha correction, and the standard-background method based on incoherently scattered radiation measurements. Additionally, the methodology editor is provided which makes it possible to create custom formulas for calculating concentrations which take into account errors in standard samples for individual elements. In the absence of standard samples, the standardless method of fundamental parameters can be used.
The developed analysis methodologies are saved for serial measurements. The methodologies include all measurement parameters, selected standard samples, formulas for calculating concentrations including ones that take into account errors in standard samples for individual elements, and also some other parameters.
Using package processing of spectra, fast processing of similar spectra in the same way is possible.
The expert mode also includes functions for recalculating measurement results onto compounds, calculating detection limits, editing the base of standard samples and other auxiliary functions.
The results of measurement processing and calculation of concentrations can be output in the form of custom reports.
Laboratory practice
This module is intended for carrying out the laboratory practice tasks. After selecting the required task, at the first stage, in accordance with the values shown in the upper part of the window, the main measurement parameters are set (current and voltage of the X-ray tube, and exposure time), and measurements are made.
At the second stage, according to prompts in the upper part of the window, processing of the acquired spectral information is performed in order to better master the theoretical part of the course.
SOFTWARE FEATURES
The measurement mode makes it possible to carry out:
- setting measurement parameters: current and voltage of the X-ray tube, and exposure time
- control of the main instrument components
- metrological verification of the instrument
- automatic measurement and calculation of concentrations according to developed analysis methodologies
Algorithms and programs for mathematical processing and modeling of spectra and background include:
- qualitative analysis (possible in automatic mode)
- comparison, subtraction and averaging of spectra
- various methods for modeling spectra and background
- taking into account escape peaks and double peaks
- semiquantitative analysis by means of the fundamental parameters method (standardless)
- quantitative methods for calculating concentrations: linear regression, the Lucas-Tooth method with and without alpha correction, the standard-background method based on incoherently scattered radiation measurements
- methodology editor with the ability to create custom formulas and take into account errors in standard samples for individual elements
- creation of automatic measurement methodologies with a full description of measurement parameters, mathematical processing of spectra and calculation options
- ability to add software modules to solve specific problems (specialized analysis methodologies, identification, sorting, grading, etc.)
The laboratory practice module includes:
- 7 laboratory practice tasks
- each task is performed step-by-step according to prompts provided right on the screen
- results of carrying out the tasks can be output in the form of custom reports