Difray-405
Desktop X-ray diffractometer
- Rapid analysis of plates and single crystals
- Simplicity of operation and reliability
- Wide range of analyzed materials
- Ability to analyze large samples
- Specialized software
TECHNICAL DESCRIPTION
Purpose
Difray-405 is a specialized instrument designed to control the surface orientation of single crystal plates and boules relative to given atomic planes. The instrument can be used to analyze single crystals of sapphire, silicon, germanium, gallium arsenide and other materials.
Operation principle
The diverging beam of radiation emitted by the X-ray tube (1) is focused with the bent crystal monochromator (2) onto the surface of a single crystal cut (5) mounted on a rotating stage (3). The diffraction maximum corresponding to the analyzed crystallographic plane is detected by a position-sensitive detector (4). The orientation of the surface of a single crystal is determined as the angle between the surface of the plate or a cut of a boule and its crystallographic plane.
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The sample is analyzed in 4 positions, which are changed by turning the stage. The measurement time in each position of the stage does not exceed 6 seconds, the measurement accuracy is ± 1΄.
TECHNICAL CHARACTERISTICS
| X-ray optical scheme | Double crystal, (n,+n), asymmetric |
| Simultaneous spectrum detection range | 6(-3,+3)° * |
| Angular aperture of spectrum detection | 24° |
| X-ray tube adjustment range | Voltage: 10 — 30 kV, current: 1 — 6 mA |
| Sample size | Diameter 20 — 200 mm, height up to 200 mm** |
| Power consumption | < 500 W |
| Power supply | Voltage 220 V, frequency 50 Hz |
| Dimensions | 630×560×490 mm |
| Weight | Up to 65 kg |
| PC interface | USB, RS-232 |
*, ** - these values can be changed depending on the properties of analyzed objects.
OPERATING CONDITIONS
| Ambient temperature | From 10 to 35°C |
| Relative humidity | Up to 80% at the temperature of 25°C |
| Atmospheric pressure | 84 — 106.7 kPa (630 — 800 mm Hg) |
| Power supply | Voltage 220±22 V, frequency 50±1 Hz |
SOFTWARE
Control of the diffractometer, data acquisition and processing of measurement results are carried out using a personal computer that runs the Windows operating system.